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Calculated using X-ray diffraction profiles simulated stress measurement error in

0 and standard deviation of residual stress An \arametersofdiffractionprofilesat coffee (or) = o. andcalculatedstandarddeviationsofpeakpositionandresidualstresydifferentmethods way to measure scan their coffee (or) === O. , 15. , 30. And 45. When the diffraction lines. For the A samples and B samples were used for determination of characteristic lines and the diffraction planes were CrK. And aFe (211); and C lines and the diffraction characteristics of the sample crystal faces were CrK. And Ni (311). For continuous measurement of the same sample 1o times the same position, with the statutory peak width at half with 2 a sin. Calculation of residual stress, respectively,[link widoczny dla zalogowanych], calculate the standard deviation of the peak position angle of A20 and the standard deviation of residual stress,[link widoczny dla zalogowanych], and the results included in Table 3. In order to investigate the above-mentioned (Section 3) the empirical formula derived reliability, according to the diffraction line parameters (see Table 3),[link widoczny dla zalogowanych], respectively, male and others by Bai Yanjun empirical formula and the formula obtained in this paper and the A20,[link widoczny dla zalogowanych], the results see Table 3. As can be seen from Table 3, the diffraction lines for the material A, the JP> 500, Bai Yanjun men, who experience formula and the results of this formula are compared with experimental results confirms the good; for materials B and C of the diffraction lines ( Cool

and (9), the calculated results closer to the experimental results. Therefore,[link widoczny dla zalogowanych], the diffraction line peak intensity IP <500 of material obtained in this paper can be applied to the formula to calculate the stress peak angle and the determination of residual stress measurement error. 6 Conclusion X-ray diffraction stress measurement line in the peak position angle and the standard deviation of residual stress and = OO diffraction lines when the HW, l Mian and √ 1 ten linear. A large number of calculation results show that the diffraction lines of different line according to their different net peak intensity were used to type 128, ( Cool

and (9) Calculate the peak angle and residual stress of error. References: [1] Bai Yanjun M, Sakamoto Hi Paul. Determination of the X-ray stress measurement error in the location of the main peak [M]. Osaka: Sumitomo Metal Research, 1975. [2] LangfordJLARapidMethodforAnalysingtheBreadthsofDiffractionandSpectralLinesUsingtheVoigtFunction [J]. JApplCryst, 1978,11:1 O a 14. E3] WuE, GrayE, MacA, eta1. ModellingDislocationInducedAnisotropicLineBroadeninginRietveldRe-finementsUsingaVoigtFunction. LGeneralPrinci-plesD]. JApplCryst ,1998,31:356 - 362. [4] Xu ice. X-ray stress analysis equipment, upgrading and X-ray stress analysis technology, some applications [D]. Shenyang: Institute of Metal Research of Chinese science, 1997. [5] South Jun Ma, Quan Zhang determined. Absorption factor on the stress measurement method in the discussion of mouth]. NDT, 1989,11 (2) :31-34. [6] Wang Yinghua. the basis of x-ray diffraction [M]. Beijing: Atomic Energy Press, 1987. [73HilleyM, LarsonJA, JatczakCF, eta1. ResidualStressMeasurementbyX-rayDiffraction, 2nded, SAEInformationReportNo. J784a [M]. Warrendale: SocietyofAutomotiveEngineers, 1971.19. r8] KuritaM, HirayamaH. AnEstimationofHardnessofHardenedSteelyX-rayDiffractionUsingaGaus-sionCurve ~ fittingMethod [J]. JournalofTestingandEvaluation, 1984,12 (1) :13-19.

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